Smart Grid challenges - Device Trustworthiness


  • Andre Waltoft-Olsen Statnett SF, Oslo and Norwegian University of Science and Technology
  • Lasse Øverlier Norwegian University of Science and Technology, Gjøvik
  • Geir Olav Dyrkolbotn Norwegian University of Science and Technology, Gjøvik
  • Arvind Sharma Norwegian University of Science and Technology, Gjøvik


The Power Grid development brings about technological design changes, resulting in increased connectivity and dependency on IoT devices. The changes offer opportunities to manipulate the IoT hardware as the root of trust. Although terrifying, hardware attacks are considered resource-demanding and rare. Nonetheless, Power Grids are attractive targets for resourceful attackers. As such, the Ukraine attacks boosted Power Grid cybersecurity focus. However, physical assurance and hardware device trustworthiness received less attention. Overhead Line Sensors are utilized in Dynamic Line Rating doctrines for Power Grids. They are potentially essential in the future to optimize conductor ampacity. Conductor optimization is crucial for Power Grids because future throughput volatility demands a high level of grid flexibility. However, there may be challenges to the integrity and availability of the data collected using Overhead Line sensors. We believe that in securing the future Smart Grid, stakeholders need to raise attention to device trustworthiness entailing the hardware layer. That said, integrated into cloud-enhanced digital ecosystems, Overhead Line Sensors can also be manipulated through the network, software, and supply chain to impact their trustworthiness.